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BSI High Sensitivity Fiber Spectrometer M series

  • M Series BSI High Sensitivity UV Enhanced Spectrometer (Backside Illuminated) utilizes Hamamatsu area array backside-illuminated CCD, and its UV sensitivity is increased by about 7 times compared to an ordinary spectrometer. At the same time, it uses 280 & 760nm double blazed grating, equipped with LVF anti-high-order filter, based on a 100.0mm focal length optical platform. It provides a balanced sensitivity and higher resolution in the full spectrum of 200~1100nm, which is suitable for a variety of Spectrometers for scientific research applications.


    Key Product Highlights

    Peak 70% UV response - utilizes Hamamatsu back-thinned CCD and have over 70% quantum efficiency in the ultraviolet 200nm, which is very suitable for Broad-spectrum measurement including ultraviolet band;


    64x2048 Super large sensing surface

    super-large sensing area CCD, which sensitivity is further improved by 4 times as compared to the ordinary 14-line pixel CCD;

     

    200-1100nm Full spectrum coverage

    M Series use optical platform with a focal length of 100.0mm which is suitable for full spectrum detection at 200~1100nm, covering the entire photosensitive area of the detector while increasing the resolution by 10%.


    Application Highlights 

    Jewellery / Ore Spectroscopy

    Desktop Raman Spectroscopy

    Desktop LIBS

    Transparent reflection/ Absorption spectrum 

    Fluorescence spectrum measurement  

    Microscopic spectroscopy 






    Product specifications and Brochures

    Product Brochure Link:  格物PDF.png

    Detection Range

    200 ~ 1100nm, depending on the grating

    Optical Resolution

    The highest 0.2nm (FWHM), based on 1800 line grating and 10μm slit, 

    Detector

    Hamamatsu, S10420, 64×2048 pixels, 64-line area array back-illuminated

    Eliminate High-order Diffraction

    3 kinds of front and 4 kinds of post filter options to eliminate ghost lines in the spectrum

    Optical Platform

    Focal length 100.0mm, f-number 4.5,   symmetrical cross CT light path

    Integration Time

    10ms ~ 120s, dark noise saturation over 120s

    Dynamic Range

    5,000:1, more than twice better than similar products, which is good for weaker signal detection

    Signal-to-noise Ratio

    800:1 (when saturated)

    Stray Light

    <0.1% @ 600nm

    Correction Linearity

    > 99%

    Step Drawings
    格物zip.png



    Configuration Example

    364.87 - 1044.91 nm / Slit 25 µm / FWHM 0.66 nm @794 nm


    M Series Wavelength, Slit and Optical Resolution Option

    ModelWavelength RangeGrating Scribe / Blaze WavelengthSlit Width
    10 um25 um50 um100 um200 um
    Optical Resolution FWHM
    M/200-1100200-1100nm300/300nm & 550nm1nm1.3nm1.8nm3nm6nm
    M/400-1000400-1000nm400 /500nm0.7nm1nm1.2nm2nm4nm
    M/350-800350-800nm600 /500nm0.8nm1nm1.2nm1.6nm3nm
    M/530-640530-640nm1800 /500nm0.2nm0.3nm0.4nm0.5nm1nm
    M/710-1100710-1100nm600 /800nm0.8nm1nm1.2nm1.6nm3nm
    M/780-1060785-1060nm830 /900nm0.38nm0.45nm0.6nm0.95nm1.8nm


    Multi Channel Upgrade Option


    Do you need more precise measurements over a broad wavelength range?  Our multi-channel spectrometers upgrade option offers a solution. Choose the desired spectrometer wavelength range, and we can integrate them into a single system (up to 4 channels) with single fiber or multi fiber output option. Please contact us for more info.


    Product Size



    Software Interface


    Main software user interface

    1.Detection Panel  (Function menu and operation buttons)

    2.Device Panel (Device list and paremeter settings)

    3.Spectral Window (Spectral curve display and spectral window management)

    4.Spectral Recording Panel (Spectral curve selection and naming)


    Key Spectral processing feature 

    ● Wavelength Smoothing 

    ● Defluoresence 

    ● Substract the background signal

    ● Rransmission and reflection measurement 

    ● Absobance measurement 

    ● Multi measurement with different timing



  • Due to the limited number of pixels in the spectrometer detector, at high spectral resolution, only a few pixels form a single spectral peak, resulting in no smooth peak, as shown in the following figure.

    This figure shows an example of peak position drift caused by temperature drift of the spectrometer at different temperatures. The spectral peak is not symmetrical because the number of pixels that make up the spectral peak is very small, and under the influence of temperature drift, the highest pixel of the spectral peak moves one pixel from left to right.


    At this point, we have two methods to evaluate the drift of this peak position.

    1. Check the position of the highest pixel point. Obviously, the peak position has shifted by one pixel, which means approximately 0.15 nm.

    2. Fit the peak values before and after drift, and find the fitted peak point between two pixels. The drift of the fitted peak point is about 0.07nm

     

    So which of these two methods is correct? We believe the second one is correct, reflecting the true drift of the peak position. The reasons are as follows.

    1.High resolution results in a low pixel sampling rate for spectral peaks, and directly observing the shape of a pixel does not reflect the actual shape of the peak.

    2.The spectral peak is physically closer to a symmetrical distribution, and the shift in peak position will not cause a change in peak shape.

    3.By fitting all the pixels that make up the spectral peak, the peak shape obtained is closer to the physical reality of the peak.


    Therefore, using fitted peak shapes to determine peak positions and evaluate spectrometer drift is the correct method.


    Is it necessary to do so in practice? It depends on the actual situation. If

     

    1.Low spectral resolution and high sampling rate of spectral peaks require more pixels to form a peak, and these pixels themselves are connected in a smoother and more symmetrical peak shape. Then, the position of the highest pixel or between two pixels can be directly found, and the peak position can be confirmed through visual evaluation.


    2.With high spectral resolution and the need to accurately know peak values, the above fitting method is required. Fitting can be achieved through spline algorithm or Gaussian or Lorentz fitting, and one can choose based on the spectral properties of the tested sample. If you don't know how to choose, please use spline curves.


  • parts

    For more information about customized accessories, please contact us sales@goptica.com

    ModelCategoryWavelengthCore DiameterLength# Number of coresInterface
    I1000-S/S-L2fiber optic360~2500nm1000um2m1SMA905-SMA905
    V1000-S/S-L2200 ~ 1100 nm1000um2m1SMA905-SMA905
    DV600-S/S-L2190~1100 nm600um2m1SMA905-SMA905
    I600-S/S-L2360~2500nm600um2m1SMA905-SMA905
    V600-S/S-L2200 ~ 1100 nm600um2m1SMA905-SMA905
    DV400-S/S-L2190~1100 nm400um2m1SMA905-SMA905
    I400-S/S-L2360~2500nm400um2m1SMA905-SMA905
    V400-S/S-L2200 ~ 1100 nm400um2m1SMA905-SMA905
    DV200-S/S-L2190~1100 nm200um2m1SMA905-SMA905
    I200-S/S-L2360~2500nm200um2m1SMA905-SMA905
    V200-S/S-L2200 ~ 1100 nm200um2m1SMA905-SMA905
    DV100-S/S-L2190~1100 nm100um2m1SMA905-SMA905
    I100-S/S-L2360~2500nm100um2m1SMA905-SMA905
    V100-S/S-L2200 ~ 1100 nm100um2m1SMA905-SMA905
    I1000-Y*2-S/S-L2

    Forked optical fiber,

     Y-shaped fiber: 2 fibers

    360~2500nm1000um2mA-2 core, B1-1 core, B2-1 coreA-SMA905 / B1-SMA905 / B2-SMA905
    V1000-Y*2-S/S-L2200 ~ 1100 nm1000um2mA-2 core, B1-1 core, B2-1 coreA-SMA905 / B1-SMA905 / B2-SMA905
    DV600-Y*7-S/S-L2190~1100 nm600um2mA-7 core, B1-1 core, B2-6 coreA-SMA905 / B1-SMA905 / B2-SMA905
    I600-Y*7-S/S-L2360~2500nm600um2mA-7 core, B1-1 core, B2-6 coreA-SMA905 / B1-SMA905 / B2-SMA905
    DV600-1*7-S/S-L2multi-core optical fiber190~1100 nm600um2m7SMA905-SMA905
    I600-1*7-S/S-L2360~2500nm600um2m7SMA905-SMA905



    Integral ball

    Wavelength 250 - 2500 nm

    Output ports can be customized

    Black anodized aluminum alloy shell

    Gilded Integral Ball

    Wavelength 1000 - 5000 nm

    Electrochemical Coating with Diffuse Reflective Film

    Halogen light source

    Wavelength 360 - 2500 nm

    Long service life, usually 10000 hours

    SMA905 interface

    Deuterium lamp light source

    Wavelength 190 - 400 nm

    Long service life, usually 1500 hours

    SMA905 interface

    Sample holder for transmittance measurementSample holder with reflectivity measurement bracket
    Colorimetric dish rackOptical support for measuring transmission and reflection samples

    Fiber optic attenuator

    Wavelength 200 - 2500 nm

    Adjustable slit for attenuation

    Fiber collimator

    Wavelength 185 - 2500 nm

    Numerical aperture 0.22 - 0.37 NA,

    Core diameter ≥ 100 µm



6 products in total Add Contrast
Product Picture Product Model Drawings And Specifications Operation
Product Picture: Product Model:M/200-1100

Back-Illuminated Spectrometer, M-Series, Wavelength: 200-1100nm

Drawings And Specifications: Operation:inquiry
Product Picture: Product Model:M/400-1000

Back-Illuminated Spectrometer, M-Series, Wavelength: 400-1000nm

Drawings And Specifications: Operation:inquiry
Product Picture: Product Model:M/350-800

Back-Illuminated Spectrometer, M-Series, Wavelength: 350-800nm

Drawings And Specifications: Operation:inquiry
Product Picture: Product Model:M/530-640

Back-Illuminated Spectrometer, M-Series, Wavelength: 530-640nm

Drawings And Specifications: Operation:inquiry
Product Picture: Product Model:M/710-1100

Back-Illuminated Spectrometer, M-Series, Wavelength: 710-1100nm

Drawings And Specifications: Operation:inquiry
Product Picture: Product Model:M/780-1060

Back-Illuminated Spectrometer, M-Series, Wavelength: 785-1060nm

Drawings And Specifications: Operation:inquiry

Please contact us for more information

  • Information request

  • Price consultation

  • Product delivery date

  • Product customization

  • Demo application

  • Sample application

  • Technical support

  • Other